电压降
发光二极管
俄歇效应
二极管
量子效率
速率方程
电流密度
材料科学
光电子学
载流子产生和复合
电流(流体)
铟镓氮化物
物理
螺旋钻
氮化镓
原子物理学
热力学
半导体
量子力学
电压
纳米技术
动力学
图层(电子)
分压器
作者
Han-Youl Ryu,Hyunsung Kim,Jong‐In Shim
摘要
Efficiency droop in InGaN light-emitting diodes (LEDs) is analyzed based on the rate equation model. By using the peak point of the efficiency versus current-density relation as the parameters of the rate equation analysis, internal quantum efficiency and each recombination current at arbitrary current density can be unambiguously determined without any knowledge of A, B, and C coefficients. The theoretical analysis is compared with measured efficiency of a LED sample and good agreement between the model and experiment is found. The investigation of recombination coefficients shows that Auger recombination alone is not sufficient to explain the efficiency droop of InGaN LEDs.
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