等离子清洗
氩
等离子体
分析化学(期刊)
微波食品加热
电子回旋共振
X射线光电子能谱
材料科学
残余气体分析仪
离子源
托尔
质谱法
化学
核磁共振
环境化学
量子力学
热力学
物理
有机化学
色谱法
作者
C. C. Tsai,W.D. Nelson,D. E. Schechter,Lauren Thompson,A.L. Glover
摘要
In a microwave electron cyclotron resonance plasma source, reactive plasmas of oxygen and its mixtures of argon have been used for evaluating plasma cleaning technologies. Small aluminum samples (0.95 x 1.9 cm) were coated with thin films ({le} 20 {micro}m in thickness) of Shell Vitrea oil and cleaned with reactive plasmas. The discharge parameters, such as gas pressure, magnetic field, substrate biasing, and microwave power, were varied to change cleaning conditions. A mass spectroscopy (or residual gas analyzer) was used to monitor the status of plasma cleaning. Mass loss of the samples after plasma cleaning was measured to estimate cleaning rates. Measured cleaning rates of low-pressure (0.5-mtorr) argon/oxygen plasmas were as high as 2.7 {micro}m/min. X-ray photoelectron spectroscopy was used to determine cleanliness of the sample surfaces. In this paper, significant results of the plasma cleaning are reported and discussed.
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