发光二极管
可靠性工程
可靠性(半导体)
LED灯
散热片
计算机科学
水准点(测量)
智能照明
汽车工程
工程类
电气工程
建筑工程
功率(物理)
物理
大地测量学
量子力学
地理
作者
Xiaohui Qu,Huai Wang,Xiaoqing Zhan,Frede Blaabjerg,Henry Shu-Hung Chung
标识
DOI:10.1109/tpel.2016.2641010
摘要
The light-emitting diode (LED) has become a very promising alternative lighting source with the advantages of longer lifetime and higher efficiency than traditional ones. The lifetime prediction of LEDs is important to guide the LED system designers to fulfill the design specifications and to benchmark the cost-competitiveness of different lighting technologies. However, the existing lifetime data released by LED manufacturers or standard organizations are usually applicable only for some specific temperature and current levels. Significant lifetime discrepancies may be seen in the field operations due to the varying operational and environmental conditions during the entire service time (i.e., mission profiles). To overcome the challenge, this paper proposes an advanced lifetime prediction method, which takes into account the field operation mission profiles and also the statistical properties of the life data available from accelerated degradation testing. The electrical and thermal characteristics of LEDs are measured by a T3Ster system, used for the electrothermal modeling. It also identifies key variables (e.g., heat sink parameters) that can be designed to achieve a specified lifetime and reliability level. Two case studies of an indoor residential lighting and an outdoor street lighting application are presented to demonstrate the prediction procedures and the impact of different mission profiles on the lifetime of LEDs.
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