Compact CMOS spectral sensor for the visible spectrum
CMOS芯片
光电子学
可见光谱
光学
材料科学
物理
电信
计算机科学
作者
Yibo Zhu,Xin Lei,Ken Xingze Wang,Zongfu Yu
出处
期刊:Photonics Research [The Optical Society] 日期:2019-08-05卷期号:7 (9): 961-961被引量:58
标识
DOI:10.1364/prj.7.000961
摘要
A compact single-shot complementary metal-oxide semiconductor (CMOS) spectral sensor for the visible range (wavelength 400–700 nm) is presented. The sensor consists of two-dimensional silicon nitride-based photonic crystal (PC) slabs atop CMOS photodetectors. The PC slabs are fabricated using one-step lithography and amenable to monolithic integration into CMOS image sensors. Featuring a small footprint of 300 μm×350 μm, the sensor can successfully measure the spectra over the 400–700 wavelength range with a best resolution of 1 nm. The footprint of the sensor may be further reduced to enable hyperspectral imaging with high spatial resolution.