铁电性
非易失性存储器
材料科学
与非门
场效应晶体管
范德瓦尔斯力
晶体管
冯·诺依曼建筑
半导体
瓶颈
光电子学
逻辑门
计算机科学
纳米技术
物理
嵌入式系统
算法
量子力学
电压
电介质
操作系统
分子
作者
Junyi Liao,Wen Wen,Juanxia Wu,Yaming Zhou,Sabir Hussain,Haowen Hu,Jia Li,Adeel Liaqat,Hongwei Zhu,Liying Jiao,Qiang Zheng,Liming Xie
出处
期刊:ACS Nano
[American Chemical Society]
日期:2023-03-13
卷期号:17 (6): 6095-6102
被引量:21
标识
DOI:10.1021/acsnano.3c01198
摘要
In-memory computing is a highly efficient approach for breaking the bottleneck of von Neumann architectures, i.e., reducing redundant latency and energy consumption during the data transfer between the physically separated memory and processing units. Herein we have designed a in-memory computing device, a van der Waals ferroelectric semiconductor (InSe) based metal-oxide-ferroelectric semiconductor field-effect transistor (MOfeS-FET). This MOfeS-FET integrates memory and logic functions in the same material, in which the out-of-plane (OOP) ferroelectric polarization in InSe is used for data storage and the semiconducting property is used for the logic computation. The MOfeS-FET shows a long retention time with high on/off ratios (>106), high program/erase (P/E) ratios (103), and stable cyclic endurance. Moreover, inverter, programmable NAND, and NOR Boolean logic operations with nonvolatile storage of the results have all been demonstrated using our approach. These findings highlight the potential of van der Waals ferroelectric semiconductor-based MOfeS-FETs in the in-memory computing and their potential of achieving size scaling beyond Moore's law.
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