Current and potential combination of atomic force microscopy with other techniques for food science

High-resolution, real-time, and in situ measurement of sample surface topography and physical/chemical properties in various conditions make atomic force microscopy (AFM) a very powerful tool for nanoscale research. The unique capabilities of AFM attract great attention among food scientists because AFM can help them deeply understand the relationship between the structure and function of food samples and food package materials. In recent years, several AFM-based combined techniques have been developed, and these new techniques will certainly provide new insight into the mechanism of processes in the food industry. In this chapter, the AFM-based combined techniques, as well as their current and potential applications in food science, will be discussed.