材料科学
热电偶
镍铬合金
薄膜
基质(水族馆)
腔磁控管
温度梯度
复合材料
增长率
曲面(拓扑)
温度测量
溅射
纳米技术
热力学
海洋学
物理
几何学
数学
量子力学
地质学
作者
Zhihui Liu,Yumeng Yang,Yi Sun,Tengda Guo,Kai Shen,Yongjun Cheng,Wang Bi,Kai Hu,Chuanbing Zhang,Gang Hao,Jiankang Zhou,Mengxuan Wu,Baoli Cui,Wanyu Ding,Zixi Wang
出处
期刊:Small
[Wiley]
日期:2024-10-10
被引量:1
标识
DOI:10.1002/smll.202404829
摘要
In the general analysis of thin-film growth processes, it is often assumed that the temperature of the film growth surface is the same as the temperature of the film growth substrate. However, a temperature gradient exists between the film growth surface and film growth substrate. Using the growth surface of TiO
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