Comparison of type II superlattice InAs/InAsSb barrier detectors operating in the mid-wave infrared range

Four types of barrier detectors based on a type II InAs/InAsSb superlattice with a wide-gap barrier made of a solid AlInAsSb lattice matched to the GaSb buffer were compared. The tested detectors differed in the type of doping of the active layer and the level and type of doping of the contact layer at the barrier. The epitaxial layers were deposited on GaAs (100) substrates using the molecular beam epitaxy method. The spectral and current–voltage characteristics of the analyzed detectors were compared. The highest current responsivities were observed in the structure with a p-type absorber (p+BpN+). Detectors with an n-type absorber (p+Bnn+, n+Bnn+, and nBnn+) show an increase in the current responsivity with an increase in the reverse bias voltage due to the reduction in the undesirable barrier in the valence band. Arrhenius characteristics for the dark current show that only in nBnn+ detectors, it was possible to limit the generation–recombination current. These detectors at 150 K were characterized by the highest normalized detectivity of approximately 3 × 1011 cm · Hz1/2/W. The obtained results were compared with literature data, showing that the parameters of type II superlattice photodetectors are close to those of HgCdTe photodiodes according to the “Rule 07” and “Rule 22” principles.