X射线光电子能谱
材料科学
分析化学(期刊)
原位
化学
化学工程
环境化学
有机化学
工程类
作者
Bassem Salem,Carlos Palacio,Hans Jörg Mathieu,D. Landolt
标识
DOI:10.1016/0169-4332(93)90435-e
摘要
Abstract Low-pressure (10 -6 -10 -8 Torr) in-situ oxidation of Fe by O 2 and O 2 plus H 2 O at room temperature has been studied by X-ray photoelectron spectroscopy. Non-linear least-squares fitting routines are applied to determine the thin oxide film composition. For exposures from 1 to 10 4 L pure iron oxidation leads to a Fe 2 O 3 layer on top of FeO. No or little FeOOH formation is observed. Some OH - is adsorbed at the surface. Exposure to a mixture of H 2 O + O 2 (50/50) does not influence the composition of the oxide film.
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