材料科学
结构精修
表征(材料科学)
冶金
结晶学
纳米技术
晶体结构
化学
作者
Jorge L. Garin,Rodolfo L. Mannheim
出处
期刊:International Journal of Materials Research
[De Gruyter]
日期:2000-10-01
卷期号:91 (10): 842-847
被引量:4
标识
DOI:10.1515/ijmr-2000-911010
摘要
Retained austenite and other microstructural components in a series of Cu-Mo-Ni-alloyed austempered ductile iron, ADI, and V-Cu-bearing austempered vermicular iron, AVI, have been determined by means of Rietveld analysis, as a promising alternative to the usual technique based on the integrated intensities of X-ray diffraction patterns. The Rietveld method utilizes all measured points of the diffraction pattern and minimizes the residual S = w i (y i - y c ) 2 with w i = l/y i , y i = observed intensity and y c =calculated intensity. For the sake of this research the analytical reflection profiles were modeled according to the Pearson VII and pseudo-Voigt functions. The described refinement procedure yielded highly precise results, as compared with the traditional techniques; besides, very useful corrections for preferred orientations, background and micro displacement of the specimen can be mathematically modeled.
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