材料科学
硅酸钠
腐蚀
薄膜
傅里叶变换红外光谱
合金
铝
涂层
浸涂
水溶液
极化(电化学)
硅酸盐
衰减全反射
钠
化学工程
冶金
复合材料
纳米技术
化学
工程类
物理化学
作者
Redouane Farid,Karthikeyan Rajan,Dilip Sarkar
标识
DOI:10.1016/j.surfcoat.2019.05.082
摘要
A simple ultrasonic dip-coating process was utilized to fabricate sodium silicate thin films on aluminum alloy substrates, and their chemical and corrosion properties were investigated as a function of their concentration in the solution. The attenuated total reflectance Fourier transmission infrared spectroscopy (ATR-FTIR) and energy dispersive X-ray spectroscopy (EDS) confirmed the presence of Na, Si, and O in the films. The polarization resistance (Rp) of the as-received aluminum substrates was found to be 10 ± 2 kΩ·cm2 in 3.5 wt% NaCl solutions. In comparison, sodium silicate thin films prepared from 1 M solution exhibited a large Rp of 593 ± 32 kΩ·cm2. The corrosion protection efficiency was calculated from the corrosion current, which was found to be 99.52%. This study shows that sodium silicate thin films can be used as a protective coating against corrosion to aluminum substrates under aqueous NaCl environments.
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