石墨
谱线
散射
材料科学
碳纤维
各向异性
电子能量损失谱
等离子体
GSM演进的增强数据速率
光谱学
分子物理学
沉积(地质)
分析化学(期刊)
计算物理学
光学
化学
物理
纳米技术
复合材料
计算机科学
古生物学
色谱法
量子力学
沉积物
透射电子显微镜
生物
电信
天文
复合数
作者
Ann-Lenaïg Hamon,Johan Verbeeck,D. Schryvers,Jan Benedikt,M. C. M. van de Sanden
摘要
Electron energy loss spectroscopy was used to investigate the bonding of plasma deposited carbon films. The experimental conditions include the use of a specific collection angle for which the shape of the spectra is free of the orientation dependency usually encountered in graphite due to its anisotropic structure. The first quantification process of the energy loss near-edge structure was performed by a standard fit of the collected spectrum, corrected for background and multiple scattering, with three Gaussian functions followed by a comparison with the graphite spectrum obtained under equivalent experimental conditions. In a second approach a fitting model directly incorporating the background subtraction and multiple scattering removal was applied. The final numerical results are interpreted in view of the deposition conditions of the films and the actual fitting procedure with the related choice of parameters.
科研通智能强力驱动
Strongly Powered by AbleSci AI