i-RAID

Solid State Disks (SSDs) are becoming increasingly popular in enterprise applications where high performance and high reliability are paramount. Although SSDs have very low read access time, their write performance is often less ideal. In addition, SSDs face some unique reliability challenges, including write-endurance, read-disturb and write-disturb. Even repeatedly reading from an SSD may cause data corruption because the read voltage may stress neighboring memory cells. As NAND continues to scale, it becomes more challenging for cells to store data reliably because read-disturb and write-disturb exacerbate. While a strong ECC (Error Correction Code) scheme can be very effective to protect young flash blocks, it may not be sufficient for aged blocks.