母线
开关设备
接触电阻
铜
电接点
材料科学
冶金
电阻和电导
复合材料
机械工程
工程类
电气工程
图层(电子)
作者
Sung Won Park,Hyunsu Cho
标识
DOI:10.1109/holm.2014.7031066
摘要
Electrical contact resistance plays an important role in temperature rise of switchgear busbars. This experimental study has been conducted to establish a practical thermal design technique for the bolted connections between copper busbars in switchgears. For this study, overlap length, contact pressure, nut factor, temperature, and arrangement of the connections were considered as test parameters to determine the contact resistance. Silver plated copper busbars were mainly used for the test specimens but the contact resistance between naked busbars was also tested to investigate the silver plating effect. Temperature rise at the busbar connection due to the contact resistance has been analyzed with the tests of the contact resistances and a numerical thermal simulation in this study.
科研通智能强力驱动
Strongly Powered by AbleSci AI