量子点
材料科学
光电子学
电子迁移率
载流子寿命
光子
纳米技术
物理
光学
硅
作者
Fuzhong Zheng,Hongbing Zhu,Yong Huang,Xiuzhen Jin,Y. Huang,Ying Wu,Jiajia Liu
出处
期刊:International Journal of Modern Physics C
[World Scientific]
日期:2023-06-09
卷期号:34 (12)
被引量:1
标识
DOI:10.1142/s012918312350167x
摘要
Studying the transport characteristics of carriers in quantum dot (QD) film provides theory support for the structure design and performance improvement of QD film device. However, time of flight experiment can only test the global optoelectric current signal brought by the carrier transport, and cannot analyze the carrier transport in the transport layer. Here, the hopping transport model of photogenerated carriers in QD films was established to study the expansion and drift movement of carriers in the PDE module of COMSOL. According to the material properties of the actual QD films, the carrier transport in single-size QD films was studied.
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