纳米晶材料
材料科学
晶界
透射电子显微镜
单层
电子束诱导沉积
电子
阴极射线
电子显微镜
能量过滤透射电子显微镜
分子物理学
光学
纳米技术
扫描透射电子显微镜
化学
物理
复合材料
微观结构
量子力学
作者
Christopher Leist,Max Makurat,Andy Jiao,Xue Liu,Grégory F. Schneider,Ute Kaiser
摘要
Abstract In this study, we explore the dynamics of grain boundaries in nanocrystalline carbon monolayers, focusing on their variation with electron beam energy and electron dose rate in a spherical and chromatic aberration-corrected transmission electron microscope. We demonstrate that a clean surface, a high-dose rate, and a 60 keV electron beam are essential for precise local control over the dynamics of grain boundaries. The structure of these linear defects has been evaluated using neural network-generated polygon mapping.
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