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100 积分 2023-05-07 加入
A Novel Wafer Defocus Measurement Method for Spot-Scanning Imaging System Using Laser Triangulation
15小时前
已关闭
Asymmetry robust centroid localization in confocalmicroscopy
1个月前
已完结
Automatic tool for quantification of nerve fibres in corneal confocal microscopy images
1年前
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Automatic tool for quantification of nerve fibres in corneal confocal microscopy images
1年前
已关闭
Elliptical polarization characterization of scattered light in dark field defect inspection technology
1年前
已关闭
A low cost mobile phone dark-field microscope for nanoparticle-based quantitative studies
1年前
已完结
Aperture design for a dark-field wafer defect inspection system
1年前
已完结
Lateral and axial resolution criteria in incoherent and coherent optics and holography, near- and far-field regimes
1年前
已完结
Image-free single-pixel object detection
1年前
已关闭
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