Lv51
1320 积分 2024-03-22 加入
TID response of hybrid FinFET with modified gate dielectric
2天前
已完结
Characteristics and ultra-high total ionizing dose response of 22 nm fully depleted silicon-on-insulator
2天前
已完结
Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors
2天前
已完结
Simulation of Total Ionizing Dose (TID) Effects Mitigation Technique for 22 nm Fully-Depleted Silicon-on-Insulator (FDSOI) Transistor
2天前
已完结
Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs
26天前
已完结
Strain Stability and Carrier Mobility Enhancement in Strained Si on Relaxed SiGe-on-Insulator
2个月前
已完结
Superior performance and Hot Carrier reliability of strained FDSOI nMOSFETs for advanced CMOS technology nodes
2个月前
已完结
Superior performance and Hot Carrier reliability of strained FDSOI nMOSFETs for advanced CMOS technology nodes
2个月前
已完结
Uniaxial Strain Enhancement in SOI Technology for the Improvement of Channel and Exterior Resistances
2个月前
已完结
Device Design and Electron Transport Properties of Uniaxially Strained-SOI Tri-Gate nMOSFETs
2个月前
已完结
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