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45 积分 2020-03-28 加入
Anisotropic stress observation of 4H‐SiC trench metal‐oxide semiconductor field‐effect transistor test structures by scanning near‐field optical Raman microscope
2个月前
已完结
Prediction of Temperature‐Dependent Stress in 4H‐SiC Using In Situ Nondestructive Raman Spectroscopy Characterization
2个月前
已完结
Stress effects on the Raman spectrum of an amorphous material: Theory and experiment ona-Si:H
3个月前
已完结
Polarized Raman spectroscopy–stress relationship considering shear stress effect
5个月前
已完结
Residual Stress Characterization in Microelectronic Manufacturing: An Analysis Based on Raman Spectroscopy
5个月前
已完结
Unusual vibron behavior and Clapeyron slope reversal in cold dense nitrogen
6个月前
已关闭
Deep-level point defects at Ga sites in dilute AlxGa1− xN alloys
6个月前
已关闭
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