Lv7
3370 积分 2023-11-19 加入
Evaluation of Interface Traps Type, Energy Level and Density of SiC MOSFETs by Means of C-V Curves TCAD Simulations
17天前
已完结
Fabrication of CFETs with Vertically Stacked p-SiGe/n-Si Channels by SiGe/Ge/Si Multilayer Epitaxy and Ge Selective Etching
1个月前
已完结
Dopant diffusion modeling for heteroepitaxial SiGe∕Si devices
1个月前
已完结
Phosphorus Profile Control in Ge by Si Delta Layers
1个月前
已完结
Automatic statistical full quantum analysis of C-V and I-V characteristics for advanced MOS gate stacks
2个月前
已完结
Phosphorus Doping and Sharp Profiles in Silicon and Silicon-Germanium Epitaxy by Rapid Thermal Chemical Vapor Deposition
2个月前
已完结
Multiscale modeling of doping processes in advanced semiconductor devices
3个月前
已完结
Calculation of dopant segregation ratios at semiconductor interfaces
3个月前
已完结
The revolution in SiGe: impact on device electronics
3个月前
已完结
Mobility and performance enhancement in compressively strained SiGe channel PMOSFETs
3个月前
已完结
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