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30 积分 2025-01-13 加入
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers
8小时前
待确认
MRAM Applications and Production
1天前
已完结
Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node
1天前
已完结
阻变存储器测试技术研究
8天前
已完结
阻变存储器测试技术研究
14天前
已完结
基于ATE与结构分析的RRAM芯片测试技术研究
14天前
已完结
Reducing burn-in time through high-voltage stress test and Weibull statistical analysis
2个月前
已关闭
Applying dynamic voltage stressing to reduce early failure rate
3个月前
已完结
Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device Reliability Issues in Advanced Technology Nodes
3个月前
已完结
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