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Oxygen Interstitial Creation in a-IGZO Thin-Film Transistors Under Positive Gate-Bias Stress
22天前
已完结
Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with and gate dielectrics
22天前
已完结
Investigation of the gate-bias induced instability for InGaZnO TFTs under dark and light illumination
22天前
已完结
Thermal analysis of amorphous oxide thin-film transistor degraded by combination of joule heating and hot carrier effect
22天前
已完结
Investigation of channel width-dependent threshold voltage variation in a-InGaZnO thin-film transistors
22天前
已完结
Time-temperature dependence of positive gate bias stress and recovery in amorphous indium-gallium-zinc-oxide thin-film-transistors
22天前
已完结
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