Lv1
40 积分 2023-12-26 加入
Physical model of a local threshold voltage shift in InGaZnO thin-film transistors under current stress for instability-aware circuit design
4小时前
已完结
Defect Engineering for High Performance and Extremely Reliable a‐IGZO Thin‐Film Transistor in QD‐OLED
9天前
已完结
Comparative Study on Performance of IGZO Transistors With Sputtered and Atomic Layer Deposited Channel Layer
9天前
已完结
Defects in Amorphous Semiconductors: The Case of Amorphous Indium Gallium Zinc Oxide
1个月前
已完结
Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors
2个月前
已完结
Reliable measurement of the density of states including occupied in-gap states of an amorphous In–Ga–Zn–O thin film via photoemission spectroscopies: Direct observation of light-induced in-gap states
2个月前
已完结
Illuminating Trap Density Trends in Amorphous Oxide Semiconductors with Ultrabroadband Photoconduction
2个月前
已完结
Increased Threshold Voltage of Amorphous InGaZnO Thin-Film Transistors After Negative Bias Illumination Stress
2个月前
已完结
Electronic Defects in Amorphous Oxide Semiconductors: A Review
2个月前
已完结
Extraction Technique for the Conduction Band Minimum Energy in Amorphous Indium–Gallium–Zinc–Oxide Thin Film Transistors
2个月前
已完结
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