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10 积分 2024-03-09 加入
Influence of threading dislocation density on early degradation in AlGaN/GaN high electron mobility transistors
3个月前
已完结
Control of epitaxial defects for optimal AlGaN/GaN HEMT performance and reliability
3个月前
已完结
Electrochemical Migration Failure under Biased HAST due to Photoresist Residues
4个月前
已完结
Electrical characterization of n-type Al0.30Ga0.70N Schottky diodes
10个月前
已完结
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