Lv2
128 积分 2023-11-21 加入
VIII. On the dielectric constant and electrical conductivity of mica in intense fields
2个月前
已关闭
Simultaneous measurement of hole lifetime, hole mobility and bandgap narrowing in heavily doped n-type silicon
2个月前
已完结
Impurity diffusion and gettering in silicon
2个月前
已关闭
A new recombination model for device simulation including tunneling
2个月前
已完结
Identification of stress factors and degradation mechanisms inducing DCR drift in SPADs
3个月前
已完结
A Low-Noise High-Photon Detection Efficiency Silicon Photomultiplier in 0.11-$\mu$m CMOS
3个月前
已完结
Identification of stress factors and degradation mechanisms inducing DCR drift in SPADs
3个月前
已完结
NUV-sensitive Deep-junction (NUV-DJ) SiPMs, a new technology optimized for fast timing applications
4个月前
已完结
NUV-HD SiPMs with metal-filled trenches
4个月前
已完结
A Back-Illuminated 10 μm-Pitch SPAD Depth Sensor with 42.5% PDE at 940 nm using an Optimized Doping Design
5个月前
已完结
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