标题 |
Effect of (111) oriented nanotwinned Cu substrate on the electromigration of Sn58Bi solder joint at high current density
(111)取向纳米孪晶Cu衬底对Sn58Bi焊点高电流密度电迁移的影响
|
网址 | |
DOI | |
其它 |
期刊:Journal of Materials Science: Materials in Electronics 作者:Jiaqi Zhang; Xingming Huang; Xiaojing Wang; Weijun Li; Zhi-Quan Liu 出版日期:2024 |
求助人 | |
下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |