标题 |
[高分]
![]() 临界应力对IGBT芯片特性的响应
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网址 | |
DOI |
暂未提供,该求助的时间将会延长,查看原因?
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其它 | K. Yamauchi and R. W. De Doncker, "Response of IGBT chip characteristics due to critical stress," 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe), Hanover, Germany, 2022, pp. 1-8. |
求助人 | |
下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |