Deep Learning-Based Multi-Species Appearance Defect Detection Model for MLCC
计算机科学
深度学习
人工智能
计算机视觉
数据建模
材料科学
模式识别(心理学)
数据库
作者
Minjie Du,Meiyun Chen,Xiuhua Cao,Kiyoshi Takamasu
出处
期刊:IEEE Transactions on Instrumentation and Measurement [Institute of Electrical and Electronics Engineers] 日期:2024-01-01卷期号:73: 1-8
标识
DOI:10.1109/tim.2024.3375957
摘要
The appearance defects in Multilayer Ceramic Capacitor (MLCC) adversely affect its performance and reliability. Thus, detecting these defects during MLCC production is imperative. However, this task faces numerous challenges, such as significant variations in the shape and size of defects, indistinct defect boundaries, and the inefficiency of manual detection methods. To address these issues, this paper proposes the RSE-YOLO model for identifying, localizing, and classifying defects in MLCC images. We design a novel backbone structure, namely the Residual Coordinate Weighted Convolutional Network, which possesses enhanced feature information extraction capabilities for accurately locating defect areas. Additionally, we introduce the Space Attention Pyramid Pooling Module to achieve weighted fusion of local and global feature information. Furthermore, the ECA-PAN is employed as the model's neck structure to facilitate the fusion of feature information at different scales, improving the model's generalization ability in multi-scale defect detection. Experimental results demonstrate that the RSE-YOLO model exhibits excellent performance on the MLCC dataset, achieving an mAP 50 of 93.9%, mAP 50-95 of 63.2%, F1 of 90.9%, and a frame rate of 57 FPS, meeting the requirements for the task of MLCC appearance defect detection.