拉曼光谱
堆积
材料科学
二硒醚
图层(电子)
透射电子显微镜
钼
高分辨率透射电子显微镜
分析化学(期刊)
纳米技术
光学
冶金
化学
有机化学
物理
硒
作者
Xin Lu,M. Iqbal Bakti Utama,Junhao Lin,Xin Luo,Yanyuan Zhao,Jun Zhang,Sokrates T. Pantelides,Wu Zhou,Su Ying Quek,Qihua Xiong
标识
DOI:10.1002/adma.201501086
摘要
Various combinations of interlayer shear modes emerge in few-layer molybdenum diselenide grown by chemical vapor deposition depending on the stacking configuration of the sample. Raman measurements may also reveal polytypism and stacking faults, as supported by first principles calculations and high-resolution transmission electron microscopy. Thus, Raman spectroscopy is an important tool in probing stacking-dependent properties in few-layer 2D materials.
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