聚焦离子束
材料科学
电池(电)
样品制备
纳米技术
电解质
阴极
沉积(地质)
固态
透射电子显微镜
复合材料
离子
工程物理
化学
电极
功率(物理)
物理
沉积物
物理化学
古生物学
生物
量子力学
有机化学
色谱法
作者
Thomas P. Demuth,Till Fuchs,Andreas Beyer,Jürgen Janek,Kerstin Volz
标识
DOI:10.1016/j.ultramic.2023.113904
摘要
Interfacial phenomena between active cathode materials and solid electrolytes play an important role in the function of solid-state batteries. (S)TEM imaging can give valuable insight into the atomic structure and composition at the various interfaces, yet the preparation of TEM specimen by FIB (focused ion beam) is challenging for loosely bound samples like composites, as they easily break apart during conventional preparation routines. We propose a novel preparation method that uses a frame made of deposition layers from the FIB's gas injection system to prevent the sample from breaking apart. This technique can of course be also applied to other loosely bound samples, not only those in the field of batteries.
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