Computer Simulation of Thick-Film Resistors Based on 3D Planar RRN Model

In this paper a 3D planar random resistor network model as a thick-film resistor model based on percolation theory combined with deterministic model is presented. Thick-film resistors are described as random resistor networks where parameters from deterministic model introduce microstructural characteristics. The percolation site model with double percolation introduces macrostructural characteristics of thick-film resistors into newly developed combined model. The model is illustrated by a computer simmulation of thick-film resistor degradation caused by high-voltage pulse stressing. Obtained results are compared with experimental results for thick-film resistors with 10kΩ/sq and 100kΩ/sq sheet resistances.