铜
X射线光电子能谱
化学状态
螺旋钻
X射线
氧化态
谱线
俄歇电子能谱
氢氧化物
氧化物
金属
分析化学(期刊)
结晶学
化学
无机化学
原子物理学
物理
核磁共振
天文
量子力学
有机化学
核物理学
色谱法
摘要
Chemical state X‐ray photoelectron spectroscopic analysis of copper species is challenging because of the complexity of the 2p spectra resulting from shake‐up structures for Cu(II) species and overlapping binding energies for Cu metal and Cu(I) species. This paper builds upon and extends previously published X‐ray photoelectron spectroscopy curve‐fitting and data analysis procedures for a wide range of copper containing species. Steps undertaken include the following: (i) an examination of existing Cu 2p 3/2 main peak and Cu 2p 3/2 – Cu L 3 M 4,5 M 4,5 Auger parameter literature data, (ii) analysis of a series of quality standard samples, (iii) curve‐fitting procedures for both the Cu 2p 3/2 and the Cu L 3 M 4,5 M 4,5 spectra (as well as associated anions), (iv) calculations that determine the amount of Cu(II) species in a mixed oxidation state system, (v) calculations and necessary data for thin film mixed oxide/hydroxide thickness measurements, and (vi) a presentation of literature and standard sample values in a Wagner (chemical state) plot. Copyright © 2017 John Wiley & Sons, Ltd.
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