铟
材料科学
薄膜
氧化铟锡
兴奋剂
基质(水族馆)
溅射沉积
氧化物
锌
锡
电阻率和电导率
分析化学(期刊)
溅射
化学计量学
冶金
光电子学
纳米技术
化学
电气工程
物理化学
海洋学
工程类
色谱法
地质学
作者
Ki Hwan Kim,Maryane Putri,Chang Young Koo,Junga Lee,Jeong-Joo Kim,Hee Young Lee
出处
期刊:Journal of KIEEME
[The Korean Institute of Electrical and Electronic Material Engineers]
日期:2013-08-01
卷期号:26 (8): 591-596
标识
DOI:10.4313/jkem.2013.26.8.591
摘要
Indium Zinc Tin Oxide (IZTO) thin films were developed as an alternative to Indium Tin Oxide (ITO) thin films. ITO material which has been acknowledged with its low resistivity and optical transparency of 85-90% has been used as major transparent conducting oxide (TCO) materials. However, due to the limited source, high price, and instability problems at high temperature of indium, many researches has been focused on indium-saving TCO materials. Mason Group of Northwestern University was reported to expand the solubility limit up to 40% by co-doping with 1:1 ratio of $Zn^{+2}$ and $Sn^{+4}$ ions. In this study, the properties of IZTO thin films corresponding to Zn/Sn different ratio were investigated. In addition, the effect of substrate temperature variable to the structural, optical and electrical properties of IZTO thin films was investigated.
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