材料科学
剪切模量
模数
复合材料
基质(水族馆)
原子单位
刚度
图层(电子)
表面力仪
石墨烯
石墨
凝聚态物理
纳米技术
物理
粘附
地质学
海洋学
量子力学
作者
Martin Rejhon,Francesco Lavini,Ali Khosravi,Mykhailo Shestopalov,Jan Kunc,Erio Tosatti,Elisa Riedo
标识
DOI:10.1038/s41565-022-01237-7
摘要
Understanding the interfacial properties between an atomic layer and its substrate is of key interest at both the fundamental and technological levels. From Fermi level pinning to strain engineering and superlubricity, the interaction between a single atomic layer and its substrate governs electronic, mechanical and chemical properties. Here, we measure the hardly accessible interfacial transverse shear modulus of an atomic layer on a substrate. By performing measurements on bulk graphite, and on epitaxial graphene films on SiC with different stacking orders and twisting, as well as in the presence of intercalated hydrogen, we find that the interfacial transverse shear modulus is critically controlled by the stacking order and the atomic layer-substrate interaction. Importantly, we demonstrate that this modulus is a pivotal measurable property to control and predict sliding friction in supported two-dimensional materials. The experiments demonstrate a reciprocal relationship between friction force per unit contact area and interfacial shear modulus. The same relationship emerges from simulations with simple friction models, where the atomic layer-substrate interaction controls the shear stiffness and therefore the resulting friction dissipation.
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