硅
材料科学
纳米晶硅
异质结
纳米晶材料
光电子学
硅太阳电池
单晶硅
纳米技术
工程物理
晶体硅
工程类
非晶硅
作者
Anamaria Steinmetz,Johannes P. Seif,Ibrahim Koc,Ioan Voicu Vulcanean,Dilara Kurt,S. Pingel,Martin Bivour
标识
DOI:10.52825/siliconpv.v1i.959
摘要
After application in thin-film silicon tandem solar cells and in lab-scale silicon heterojunction (SHJ) devices, doped nanocrystalline silicon (nc) layers now arrived on the industrial stage. Despite their challenging deposition, the benefits they hold with respect to even higher device performance compared to their amorphous counterparts are significant and justify additional effort. In this contribution we report on developments towards industrially applicable processes for n- and p-doped silicon layers, nc-Si(n) and nc-Si(p), and their implementation in SHJ cells. Our investigation focuses on the impact of deposition temperature (Tdep) and the need for a thin oxide layer to promote fast nucleation of thin, sufficiently crystalline, doped nc-Si films in a single deposition chamber powered at 13.56 MHz. We identified main challenges for thin film and contact engineering and reached efficiencies of 23.0% with n- and 23.1% with p-type nc-Si approaching cell performances of our process of record based on amorphous Si (a-Si) layers.
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