材料科学
微电子机械系统
硅
光学
法布里-珀罗干涉仪
压力传感器
光电子学
振膜(声学)
光学腔
压力测量
激光器
振动
声学
物理
气象学
热力学
波长
作者
Xiaoshuang Dai,Shuang Wang,Junfeng Jiang,Hongpeng Yang,Ke Tan,Zhiyuan Li,Tiegen Liu
出处
期刊:Optics Express
[The Optical Society]
日期:2022-08-17
卷期号:30 (18): 31840-31840
被引量:2
摘要
In this paper, a high sensitivity pressure sensor employing an internal-external cavity Vernier effect is innovatively achieved with the microelectromechanical systems (MEMS) Fabry-Perot (FP) interferometer. The sensor consists of silicon cavity, vacuum cavity, and silicon-vacuum hybrid cavity, which is fabricated by direct bonding a silicon diaphragm with an etched cylindrical cavity and a silicon substrate. By rationally designing the optical lengths of the silicon cavity and silicon-vacuum hybrid cavity to match, the internal-external cavity Vernier effect will be generated. The proposed cascaded MEMS FP structure exhibits a pressure sensitivity of -1.028 nm/kPa by tracking the envelope evolution of the reflection spectrum, which is 58 times that of the silicon-vacuum hybrid cavity. What's more, it owns a minimal temperature sensitivity of 0.041 nm/°C for the envelope spectrum. The MEMS FP sensor based on internal-external cavity Vernier effect as the promising candidate provides an essential guideline for high sensitivity pressure measurement under the characteristic of short FP sensing cavity length, which demonstrates the value to the research community.
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