拉曼光谱
纳米晶材料
材料科学
微观结构
拉曼散射
立方氧化锆
氧化钇稳定氧化锆
薄膜
声子
分析化学(期刊)
矿物学
光学
纳米技术
陶瓷
复合材料
凝聚态物理
化学
物理
色谱法
作者
Igor Kosacki,Vladimir Petrovsky,Harlan U. Anderson,Philippe Colomban
标识
DOI:10.1111/j.1151-2916.2002.tb00509.x
摘要
The results of Raman‐scattering studies of nanocrystalline CeO 2 and ZrO 2 :16% Y (YSZ) thin films are presented. The relationship between the lattice disorder and the form of the Raman spectra is discussed and correlated with the microstructure. It is shown that the Raman line shape results from phonon confinement and spatial correlation effects and yields information about the material nonstoichiometry level.
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