材料科学
涂层
蚀刻(微加工)
氢氧化钾
基质(水族馆)
铁氰化钾
氢氧化钠
各向同性腐蚀
化学工程
表面粗糙度
表面光洁度
薄脆饼
图层(电子)
复合材料
纳米技术
无机化学
化学
工程类
地质学
海洋学
作者
Mitsunori Toyoda,Ryo Yokoyama,Shuntaro Waki,Toshiyuki Kakudate,Jun Chen
标识
DOI:10.35848/1882-0786/abf666
摘要
This work examined a novel etching procedure for the complete removal of Mo/Si multilayer coatings, as a means of reusing valuable mirror substrates employed in extreme ultraviolet imaging. A multilayer coating deposited on a fused silica substrate was etched with an alkaline solution containing potassium ferricyanide and sodium hydroxide, and the entire coating was removed within 60 min. The root mean square roughness and power spectrum density characteristics were subsequently assessed and the resulting values were equivalent to those before the deposition of the coating. These results demonstrate that such coatings can be removed while maintaining the original surface figure.
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