可靠性(半导体)
可靠性工程
材料科学
计算机科学
光电子学
工程类
物理
量子力学
功率(物理)
作者
M. Yazdan Mehr,W.D. van Driel,Guo Qi Zhang
出处
期刊:Solid state lighting technology and application series
日期:2017-07-12
卷期号:: 115-139
被引量:4
标识
DOI:10.1007/978-3-319-58175-0_5
摘要
Lumen depreciation is one of the major failure modes in light-emitting diode (LED) systems.It originates from the degradation of the different components within the system, including the chip, the driver, and the optical materials (i.e., phosphorous layer).The kinetics of degradation in real-life applications is relatively slow, and in most cases, it takes several years to see an obvious deterioration of optical properties.A highly accelerated stress testing (HAST) setup and a methodology to extrapolate the results to real applications are therefore needed to test the reliability of LED package and lens materials.Employing HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time.This chapter aims at briefly explaining the degradation mechanism of optical components in LED package and how they contribute to the lumen depreciation of the LED package.The concept of HAST and the way the reliability of LED packages can be assessed will also be explained.
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