角分辨光电子能谱
材料科学
凝聚态物理
光电发射光谱学
费米能级
单层
拉曼光谱
电子能带结构
方向错误
分子物理学
电子结构
X射线光电子能谱
光学
物理
纳米技术
电子
核磁共振
微观结构
量子力学
晶界
冶金
作者
Lama Khalil,Debora Pierucci,Emilio Vélez,J. Ávila,C. Vergnaud,Pavel Dudin,Fabrice Oehler,Julien Chaste,M. Jamet,Emmanuel Lhuillier,Marco Pala,Abdelkarim Ouerghi
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2022-11-07
卷期号:34 (4): 045702-045702
被引量:4
标识
DOI:10.1088/1361-6528/ac9abe
摘要
Abstract Nearly localized moiré flat bands in momentum space, arising at particular twist angles, are the key to achieve correlated effects in transition-metal dichalcogenides. Here, we use angle-resolved photoemission spectroscopy (ARPES) to visualize the presence of a flat band near the Fermi level of van der Waals WSe 2 /MoSe 2 heterobilayer grown by molecular beam epitaxy. This flat band is localized near the Fermi level and has a width of several hundred meVs. By combining ARPES measurements with density functional theory calculations, we confirm the coexistence of different domains, namely the reference 2H stacking without layer misorientation and regions with arbitrary twist angles. For the 2H-stacked heterobilayer, our ARPES results show strong interlayer hybridization effects, further confirmed by complementary micro- Raman spectroscopy measurements. The spin-splitting of the valence band at K is determined to be 470 meV. The valence band maximum (VBM) position of the heterobilayer is located at the Γ point. The energy difference between the VBM at Γ and the K point is of −60 meV, which is a stark difference compared to individual single monolayer WSe 2 and monolayer WSe 2 , showing both a VBM at K .
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