负阻抗变换器
CMOS芯片
晶体管
电气工程
电压
电容
计算机科学
缩放比例
电子工程
物理
工程类
电压源
几何学
电极
数学
量子力学
作者
Hussam Amrouch,Victor M. van Santen,Girish Pahwa,Yogesh Singh Chauhan,Jörg Henkel
标识
DOI:10.1109/asp-dac47756.2020.9045415
摘要
Negative Capacitance Field Effect Transistor (NCFET) is one of the promising emerging technologies that may overcome the fundamental limits of conventional CMOS technology. NCFET features a ferroelectric (FE) layer within the transistor's gate, which internally amplifies the voltage, allowing NCFET to operate at a lower voltage while sustaining performance at considerable energy savings. In this work, we raise awareness that n- and p-NCFET transistors are asymmetrically affected by the FE layer and show, for the first time, how this asymmetry results in unbalanced circuit performance (e.g., longer fall than rise propagation delay, reduced noise margins). As NCFET are meant to maintain performance while reducing power, we present a solution by scaling the number of fins in n-NCFET to regain symmetry. We optimize iteratively in conjunction with supply voltage scaling to find the minimal energy consumption while maintaining performance. In our first case study, we achieve at least 34% lower power consumption and thus 34% higher energy efficiency as the circuit exhibits identical propagation delay. However, our second case study reveals that NCFETs can consume 3× more power and energy than the FinFET design. In summary, not considering the asymmetry and replacing FinFET with current-matched NCFET results in unreliable circuits (timing violations). This work exemplifies how the power and energy consumption of a NCFET circuit might surpass that of a FinFET, if circuits are designed considering asymmetry and circuit metric matching.
科研通智能强力驱动
Strongly Powered by AbleSci AI