佩多:嘘
导电原子力显微镜
聚(3,4-亚乙基二氧噻吩)
电导率
苯乙烯
导电聚合物
材料科学
磺酸盐
导电体
原子力显微镜
纳米技术
化学工程
光电子学
复合材料
聚合物
图层(电子)
化学
共聚物
钠
物理化学
冶金
工程类
作者
Xuan‐Dung Dang,Mark Dante,Thuc‐Quyen Nguyen
摘要
Morphology and conductivity modifications in poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) films induced by conductive atomic force microscopy probe are investigated. At an applied bias of positive or negative 10 V, raised features of 12.8±1.8 nm in height are generated and the local film conductivity is reduced. The feature height formation is irreversible and dependent on both applied bias and tip velocity. The mechanism by which these features are generated is proposed to be mass transport of PSS− to the surface under the atomic force microscope tip. This finding may open up the possibility of patterning PEDOT:PSS films, and thereby organic optoelectronic devices.
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