光学相干层析成像
材料科学
保形涂层
印刷电路板
显微镜
涂层
无损检测
光学
光学显微镜
图层(电子)
断层摄影术
共形映射
分辨率(逻辑)
计算机科学
复合材料
人工智能
物理
数学分析
放射科
扫描电子显微镜
操作系统
医学
数学
作者
Xiao Shao,Xinjian Chen,Xiaojun Yu,Ya Wen Hu,Linbo Liu,Fei Shi,Wei Shao,Jianhua Mo
出处
期刊:IEEE Access
[Institute of Electrical and Electronics Engineers]
日期:2019-01-01
卷期号:7: 18138-18145
被引量:14
标识
DOI:10.1109/access.2019.2896622
摘要
Conformal coating (CC) is widely used to protect printed circuit board from corrosion, mold growth, and electrical failures. To ensure effective protection, the thickness of the CC layer needs to be well controlled. However, to date, the coating thickness is usually measured in a destructive way under microscopes. In this paper, we proposed to use optical coherence tomography (OCT) to measure the CC thickness nondestructively. Specifically, to obtain a good accuracy in thickness measurement, we constructed a spectral domain OCT with the ultra-high axial resolution to image the CC layer in three dimensions and developed an image segmentation algorithm to detect the CC layer from the OCT images. Finally, we evaluated the effectiveness of the proposed method by comparing it with the conventional method, and the results demonstrate that the measurement by our method is consistent with that by the microscope. This also indicates that OCT with high axial resolution can potentially be used to measure the CC thickness accurately and nondestructively.
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