公制(单位)
计算机科学
人工智能
代表(政治)
相似性(几何)
点(几何)
深度学习
航程(航空)
编码(集合论)
机器学习
源代码
模式识别(心理学)
图像(数学)
数学
操作系统
几何学
政治
复合材料
经济
集合(抽象数据类型)
材料科学
程序设计语言
法学
运营管理
政治学
作者
Sijie Zhu,Taojiannan Yang,Chen Chen
出处
期刊:IEEE transactions on image processing
[Institute of Electrical and Electronics Engineers]
日期:2021-01-01
卷期号:30: 7593-7607
被引量:24
标识
DOI:10.1109/tip.2021.3107214
摘要
This work explores the visual explanation for deep metric learning and its applications. As an important problem for learning representation, metric learning has attracted much attention recently, while the interpretation of the metric learning model is not as well-studied as classification. To this end, we propose an intuitive idea to show where contributes the most to the overall similarity of two input images by decomposing the final activation. Instead of only providing the overall activation map of each image, we propose to generate point-to-point activation intensity between two images so that the relationship between different regions is uncovered. We show that the proposed framework can be directly applied to a wide range of metric learning applications and provides valuable information for model understanding. Both theoretical and empirical analyses are provided to demonstrate the superiority of the proposed overall activation map over existing methods. Furthermore, our experiments validate the effectiveness of the proposed point-specific activation map on two applications, i.e. cross-view pattern discovery and interactive retrieval. Code is available at https://github.com/Jeff-Zilence/Explain Metric Learning.
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