纳米技术
纳米-
材料科学
X射线探测器
探测器
工程物理
工程类
电气工程
复合材料
作者
Xiangyu Ou,Zhongzhu Hong,Qinxia Wu,Xiaofeng Chen,Lili Xie,Zhenzhen Zhang,He Yu,Qiushui Chen,Huanghao Yang
出处
期刊:ACS Nano
[American Chemical Society]
日期:2024-09-23
标识
DOI:10.1021/acsnano.4c09554
摘要
The growing demands for X-ray imaging applications impose diverse and stringent requirements on advanced X-ray detectors. Among these, flexibility stands out as the most expected characteristic for next-generation X-ray detectors. Flexible X-ray detectors can spatially conform to nonflat surfaces, substantially improving the imaging resolution, reducing the X-ray exposure dosage, and enabling extended application opportunities that are hardly achievable by conventional rigid flat-panel detectors. Over the past years, indirect- and direct-conversion flexible X-ray detectors have made marvelous achievements. In particular, microscale and nanoscale engineering technologies play a pivotal role in defining the optical, electrical, and mechanical properties of flexible X-ray detectors. In this Perspective, we spotlight recent landmark advancements in flexible X-ray detectors from the aspects of micro/nano engineering strategies, which are broadly categorized into two prevailing modalities: materials-in-substrate and materials-on-substrate. We also discuss existing challenges hindering the development of flexible X-ray detectors, as well as prospective research opportunities to mitigate these issues.
科研通智能强力驱动
Strongly Powered by AbleSci AI