71‐2: Subpixel Non‐Uniformity Correction for Displays

For emissive display such as OLED or MicroLED displays, the non‐uniformity or Mura is caused by subpixel (r, g, b subpixels) level non‐uniformity from TFT driving or material uniformity. This non‐uniformity affects each subpixel, thus requires sub‐pixel non‐uniformity correction. The measurement accuracy of the brightness of red, green, and blue subpixels is a key factor that affects the performance of the demura system. In this paper we modeled the imaging chain of measuring the display subpixel brightness and described an image processing algorithm to derive the subpixel brightness of each subpixels. The accuracy of subpixel brightness is evaluated with the contrast transfer function of grating pattern of different frequencies. The contrast of the grating from the measured single subpixel grating is about 82% of the original contrast and two‐pixel and above lines almost 100% of the original.