工程物理
功率半导体器件
数码产品
结温
材料科学
可靠性(半导体)
电力电子
包装工程
电气工程
半导体器件
电源模块
纳米技术
功率(物理)
机械工程
工程类
物理
图层(电子)
量子力学
电压
作者
Yuan Qin,Benjamin Albano,Joseph Spencer,James Spencer Lundh,Boyan Wang,Cyril Buttay,Marko J. Tadjer,Christina DiMarino,Yuhao Zhang
标识
DOI:10.1088/1361-6463/acb4ff
摘要
Abstract Power semiconductor devices are fundamental drivers for advances in power electronics, the technology for electric energy conversion. Power devices based on wide-bandgap (WBG) and ultra-wide bandgap (UWBG) semiconductors allow for a smaller chip size, lower loss and higher frequency compared with their silicon (Si) counterparts, thus enabling a higher system efficiency and smaller form factor. Amongst the challenges for the development and deployment of WBG and UWBG devices is the efficient dissipation of heat, an unavoidable by-product of the higher power density. To mitigate the performance limitations and reliability issues caused by self-heating, thermal management is required at both device and package levels. Packaging in particular is a crucial milestone for the development of any power device technology; WBG and UWBG devices have both reached this milestone recently. This paper provides a timely review of the thermal management of WBG and UWBG power devices with an emphasis on packaged devices. Additionally, emerging UWBG devices hold good promise for high-temperature applications due to their low intrinsic carrier density and increased dopant ionization at elevated temperatures. The fulfillment of this promise in system applications, in conjunction with overcoming the thermal limitations of some UWBG materials, requires new thermal management and packaging technologies. To this end, we provide perspectives on the relevant challenges, potential solutions and research opportunities, highlighting the pressing needs for device–package electrothermal co-design and high-temperature packages that can withstand the high electric fields expected in UWBG devices.
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