平版印刷术
干扰(通信)
光学
无光罩微影
材料科学
薄脆饼
激光器
激光二极管
干涉光刻
光电子学
干涉测量
二极管
计算机科学
电子束光刻
物理
抵抗
制作
纳米技术
频道(广播)
电信
替代医学
医学
病理
图层(电子)
作者
Yohei Nawaki,Kohei Toyoda,Shunta Sugisaki,Shinji Orihara,T. Nomura,Kentaro Nomoto,Kazuyuki Tsuruoka
摘要
The interference lithography is a promising technique for waveguide combiners and distributed feedback laser diodes. However, the technology has not been applied in mass production due to three issues. The first is an insufficient fringe pitch accuracy. The second is a deterioration of patterning quality due to low exposure contrast. And, last is time consuming alignment processes. We have developed an interference lithography system applied with technologies of a high precision wafer stage, a diode pumped solid-state laser with a wavelength of 266 nm and high accuracy actuators. The system has a patterning pitch accuracy of 0.01 nm, a patterning direction angle accuracy of 0.01 degree, an ability to form clear patterns with excellent exposure contrast and an automatical beam alignment for capability of mass production. We will present an overview of the system for achieving the specifications, and examples of processing.
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