吸附
铜
硫酸
腐蚀
扫描电子显微镜
朗缪尔吸附模型
电化学
X射线光电子能谱
材料科学
铜水管的冲蚀腐蚀
无机化学
化学
基质(水族馆)
化学工程
冶金
物理化学
复合材料
电极
海洋学
工程类
地质学
作者
Wenpo Li,Wei Luo,Xinke Yu,Chaowei Ma,Yan Xiong,Bochuan Tan,Yujie Qiang
标识
DOI:10.1016/j.molliq.2022.119100
摘要
In this work, a new anti-corrosion regent 3-chloro-6-mercaptopyridazine (CMP) for copper in 0.5 M H2SO4 solution is developed for the first time. Various electrochemical methods were applied to study the corrosion inhibition performance of CMP which was further confirmed through scanning electron microscope (SEM) and atomic force microscope (AFM). Electrochemical results show that CMP can have a good effect on the inhibition of the copper corrosion in H2SO4 solution under all testing temperature conditions. The highest inhibition efficiency of CMP is 97.4%, 95.1%, and 95.0% in 298 K, 303 K, and 308 K, respectively. It can be found that the corrosion inhibition effectiveness is negatively related to temperature and positively related to the concentration. In addition, the Langmuir isotherm adsorption model is suitable for the adsorption process of CMP on copper substrate, and the ΔG0ads value is less than − 40 kJ/mol. The experimental results show that the adsorption type between CMP and copper surface is chemical adsorption, further demonstrated by the N-Cu and S-Cu bonds in XPS. Finally, through quantum chemical calculation and molecular dynamics simulation, it have been further verified that the Cu(1 1 1) surface is in close contact with the CMP in a parallel manner, confirming its possessing good corrosion inhibition performance in sulfuric acid solution.
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