高分辨率透射电子显微镜
堆积
材料科学
甲醛
烧焦
苯酚
碳纤维
碳数
分析化学(期刊)
化学工程
结晶学
复合材料
透射电子显微镜
化学
纳米技术
复合数
热解
色谱法
有机化学
工程类
烷基
作者
Atul Sharma,Takashi Kyotani,Akira Tomita
出处
期刊:Carbon
[Elsevier]
日期:2000-01-01
卷期号:38 (14): 1977-1984
被引量:193
标识
DOI:10.1016/s0008-6223(00)00045-2
摘要
A new technique to obtain structural parameters Lc, La and d, of phenol formaldehyde resin char (PFC) from TEM images has been developed. Similar structural parameters were also obtained from XRD technique and a comprehensive comparison of the results from the two techniques was made. The present study shows a good agreement between the results from the two techniques. The TEM technique also provided additional information about the distribution of layer size with stacking number, which can not be obtained from XRD technique.
科研通智能强力驱动
Strongly Powered by AbleSci AI